Purpose:
The 9J-V image light section microscope is one of the original classic products of our company. It is an upgraded product of the basic 9J light section microscope, equipped with a digital imaging system. The instrument measures the microscopic unevenness of the machined surface of the part by the light section method. It is suitable for measuring 1.0-80 microns, that is, the original standard ▽3-▽9 surface finish. It can also be used to measure the depth of surface scratches, scribes or certain defects.
The characteristics of light sectioning are carried out without damaging the surface. is an indirect measurement method. That is, the unevenness of the marks can be determined only after calculation.
the complete set of equipment:
- 1 instrument body
- 1 micrometer eyepiece
- Coordinate table 1 piece
- 1 V-shaped block
- 1 piece of standard carving ruler (with box)
- 7 x objectives
- 14 x objective 1 set
- 8.30 x objective 1 set
- 60 x objective 1 set
- 1 adjustable transformer 220/4 to 6/5VA
- 1LED light source
- 1 set of special digital adaptive mirror and interface
- Digital camera system (USB port) 1 set
- Branded business computer (optional)
Specifications
| Measuring range unevenness average height value
(microns) |
Surface finish level | required objective lens | total magnification | Objective lens assembly
working distance (mm) |
field of view
(mm) |
| ＞0.8～1.6 ＞1.6～6.3 ＞6.3～20 ＞20～80 |
9 8～7 6～5 4～3 |
60×N.A.0.55 30×N.A.0.40 14×N.A.0.20 7×N.A.0.12 |
510× 260× 120× 60× |
0.04 0.2 2.5 9.5 |
0.3 0.6 1.3 2.5 |
The magnification of the photographic device is about 6 times
Measuring unevenness range (1.0～80) microns
Uneven width with micrometer eyepiece 0.7μm～2.5mm
With coordinate table (0.01～13) mm
Instrument weight about 23 kg
Overall dimensions about 180 × 290 × 470 mm
